UNIVERSITY OF WATERLOO - NOTICE OF INTENT TO AWARD A SINGLE SOURCE CONTRACT: 19-069
Spectroscopic Imaging Ellipsometer for structured ultrathin films
The University of Waterloo (UW) is investigating a single source purchase from Accurion Inc. of Cupertino, CA, USA, for the purchase of a Spectroscopic Imaging Ellipsometer for structured ultrathin films. The budget for this entire package is less than $200,000.00 CAD, not including HST.
This is an Advanced Notice indicating to the supplier community that UW may award a contract for this equipment to a pre-identified supplier. If no other supplier submits, on or before the closing date of this notice, a statement of specifications that satisfies the stated requirements set out in this Notice, the competitive requirements of the University are considered to have been met. Following notification to any suppliers not successful in demonstrating that their statement of specifications meets the requirements set out in this Notice, the contract may then be awarded to the pre-identified supplier.
If other potential suppliers submit statements of specifications during the fifteen calendar day posting period, and meet the requirements set out in this Notice, UW will proceed to a Request for Proposal process, in order to award the contract.
Process - Suppliers who can provide equivalent equipment with proven functionality required for the research, within budget, are encouraged to submit a statement of specifications, in writing, to the contact person identified in this Notice on or before the closing date of this Notice. The statement of specifications must unequivocally demonstrate how the supplier meets these advertised requirements within budget.
SPECIFICATIONS –
A Spectroscopic Imaging Ellipsometer with the following capabilities:
1. Surface imaging and ellipsometric measurements at a lateral ellipsometric resolution down to 1 µm
2. Spectral n and k measurements over the spectral range from 360 to 1000 nm
3. Variable angle measurements over the angle-of-incidence range from 40 to 90 degrees
4. Capable to sample sizes up to 100 mm in XY and automated large area image stitching
5. Provides ellipsometric contrast micrographs
6. Capable to set different regions-of-interest and measure these single or multiple in parallel
Options:
1. Capable to eliminate backside reflection on very thin transparent substrates
2. Imaging Mueller Matrix Ellipsometry for characterizing micro-structured anisotropic thin films
SOLE SOURCE JUSTIFICATION
The University is not aware of any other supplier/manufacturer that can provide this equipment capable of imaging ability with 1 micron lateral resolution within the stated budget.
Date of issue: Monday, June 3, 2019
Closing Date: Tuesday, June 18, 2019 at 2:30 p.m. EST
Contact:
Christine Wagner, CPPB, CSCP – Research Coordinator and Senior Buyer
Procurement and Contract Services
University of Waterloo
Ph: 519-888-4567 ext. 32074
Email – cpwagner@uwaterloo.ca, or, procure@uwaterloo.ca
